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Inter-crystallite nanoretention of self-etching adhesives at enamel imaged by transmission electron microscopy
The purpose of this in vitro study was to analyse the mode of action of self‐etching adhesive systems when applied for resin‐to‐enamel bonding. Transmission electron microscopy was used to investigate the enamel–resin interface after application of non‐rinsing self‐etching adhesive systems based on...
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Published in: | European journal of oral sciences 2002-12, Vol.110 (6), p.464-470 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The purpose of this in vitro study was to analyse the mode of action of self‐etching adhesive systems when applied for resin‐to‐enamel bonding. Transmission electron microscopy was used to investigate the enamel–resin interface after application of non‐rinsing self‐etching adhesive systems based on phosphoric acid estered methacrylates (Clearfil Liner Bond 2, Clearfil SE Bond, Etch & Prime 3.0 and Resulcin AquaPrime) compared with conventional phosphoric acid etching and bonding (Heliobond). Non‐decalcified ultrathin sections from the interface between enamel and self‐etching adhesive systems revealed a 1.5–3.2‐µm deep enamel surface layer characterized by a less‐dense arrangement of enamel crystallites separated from each other by nanometer‐sized spaces. A 1.5–3.2‐µm wide, netlike resinous structure was observed in corresponding decalcified specimens, indicating that self‐etching priming agents dissolve the peripheral and central part of the enamel crystallites, while simultaneously promoting inter‐ and intra‐crystallite monomer infiltration. A similar pattern, but greater depth (6.9 µm) of enamel surface hybridization was found in the phosphoric acid‐etched and bonded specimens. The nanoretentive interlocking between enamel crystallites and resin could explain the potential of self‐etching adhesive systems in resin‐to‐enamel bonding despite the less distinct enamel etching pattern observed in scanning electron microscopy investigations. |
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ISSN: | 0909-8836 1600-0722 |
DOI: | 10.1034/j.1600-0722.2002.21326.x |