Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

A combined scanning near field optical/atomic force microscope (AFM) is used to obtain surface force measurements between a near field sensing tip and a tapered optical fibre surface, whilst simultaneously detecting the intensity of the evanescent field emanating from the fibre. The tapered optical...

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Bibliographic Details
Published in:Ultramicroscopy 2003-04, Vol.94 (3), p.283-291
Main Authors: Huntington, S.T., Hartley, P.G., Katsifolis, J.
Format: Article
Language:English
Subjects:
AFM
Algorithms
Atomic force microscopes
Distance
Evanescent field
Exact sciences and technology
Force curves
High resolution
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Microscopy, Atomic Force - methods
Near-field scanning optical microscopes
Optical fibre
Optics and Photonics - instrumentation
Physics
Radiation
Scanning probe microscopes, components and techniques
SNOM
Surface Properties
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Description
Summary:A combined scanning near field optical/atomic force microscope (AFM) is used to obtain surface force measurements between a near field sensing tip and a tapered optical fibre surface, whilst simultaneously detecting the intensity of the evanescent field emanating from the fibre. The tapered optical fibre acts as a compliant sample to demonstrate the possible use of the near field intensity measurement system in determining ‘real’ surface separations from normal AFM surface force measurements at sub-nanometer resolution between deformable surfaces.
ISSN:0304-3991
1879-2723
DOI:10.1016/S0304-3991(02)00338-8