Statistics of backscattering in optical waveguides

The statistics of backscattering induced by sidewall roughness in dielectric optical waveguides is experimentally investigated. We demonstrate that waveguide backscattering is a wavelength-dependent random process, whose statistics follows the rules of single scattering systems, independently of sha...

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Bibliographic Details
Published in:Optics letters 2010-06, Vol.35 (11), p.1777-1779
Main Authors: MORICHETTI, Francesco, CANCIAMILLA, Antonio, MELLONI, Andrea
Format: Article
Language:English
Subjects:
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Optical elements, devices, and systems
Optical waveguides and coupleurs
Optics
Physics
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Summary:The statistics of backscattering induced by sidewall roughness in dielectric optical waveguides is experimentally investigated. We demonstrate that waveguide backscattering is a wavelength-dependent random process, whose statistics follows the rules of single scattering systems, independently of shape, size, and refractive index contrast of the waveguide, and of the light polarization state. The intensity of backscattering is distributed according to an exponential probability density function, and its mean delay corresponds to a reflection at half the effective length of the waveguide.
ISSN:0146-9592
1539-4794
DOI:10.1364/ol.35.001777