Delayed light imaging for the early detection of plant stress [Physiological disturbances of leaves exposed to sulfur dioxide]

Image-intensified photographs of delayed light emission (DLE) from soybean leaves exposed to sulfur dioxide showed evidence of the stress that developed during the exposure period. A comparison of DLE images taken during the fumigation with a conventional photograph taken 5 days later showed a clear...

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Bibliographic Details
Published in:Science (American Association for the Advancement of Science) 1982-02, Vol.215 (4536), p.1104-1106
Main Authors: Ellenson, James L., Amundson, Robert G.
Format: Article
Language:English
Subjects:
Chlorophylls
Fumigation
Imaging systems
Leaf area
Leaves
Light emission
Necrosis
Plant stress
Plants
Soybeans
Sulfur dioxide
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Summary:Image-intensified photographs of delayed light emission (DLE) from soybean leaves exposed to sulfur dioxide showed evidence of the stress that developed during the exposure period. A comparison of DLE images taken during the fumigation with a conventional photograph taken 5 days later showed a clear correspondence between leaf areas that had the most diminished DLE intensity and those that showed the greatest visible injury. These results suggest that DLE imagery will be a useful tool in the investigation of the spatial distribution and temporal development of plant stress.
ISSN:0036-8075
1095-9203
DOI:10.1126/science.215.4536.1104