Atomic force microscope studies of fullerene films - Highly stable C60 fcc (311) free surfaces

Atomic force microscopy and X-ray diffractometry were used to study 1500 A-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrte. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond t...

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Bibliographic Details
Published in:Science (American Association for the Advancement of Science) 1991-07, Vol.253 (5016), p.171-173
Main Authors: Snyder, Eric J., Tong, William M., Williams, R. S., Anz, Samir J., Anderson, Mark S.
Format: Article
Language:English
Subjects:
Atomic force microscopy
Buckminsterfullerene
Solid-State Physics
X-ray diffractometer
X-ray diffractometers
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Summary:Atomic force microscopy and X-ray diffractometry were used to study 1500 A-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrte. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.
ISSN:0036-8075
1095-9203
DOI:10.1126/science.253.5016.171