Application of High-Resolution Semiconductor Detectors in X-ray Emission Spectrography

Solid-state devices developed primarily for nuclear gamma spectroscopy have many potential uses in x-ray analysis.

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Bibliographic Details
Published in:Science (American Association for the Advancement of Science) 1966-02, Vol.151 (3710), p.562-568
Main Authors: Bowman, Harry R., Hyde, Earl K., Thompson, Stanley G., Jared, Richard C.
Format: Article
Language:English
Subjects:
Amplifiers
Energy
Germanium
Lead
Materials
Metal foils
Photons
Radiation detectors
Semiconductors
Silicon
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Description
Summary:Solid-state devices developed primarily for nuclear gamma spectroscopy have many potential uses in x-ray analysis.
ISSN:0036-8075
1095-9203
DOI:10.1126/science.151.3710.562