Analysis of the interference pattern in a cross-grating interferometer

A structured source is used to illuminate the four-beam cross-grating interferometer to cause the interference fringes to localize at different planes. When a monochromatic spatially incoherent source is used, the amplitude transmittance of the first cross grating can be imaged to different location...

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Bibliographic Details
Published in:Applied optics (2004) 1988-07, Vol.27 (14), p.3025-3034
Main Author: Cheng, Y S
Format: Article
Language:English
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Summary:A structured source is used to illuminate the four-beam cross-grating interferometer to cause the interference fringes to localize at different planes. When a monochromatic spatially incoherent source is used, the amplitude transmittance of the first cross grating can be imaged to different locations in various planes. With white light extended source illumination, a cross-gratinglike pattern can be formed not only near but also far away from the optical axis simply by choosing four beams of equal path length to interfere. A multicross-grating interferometer is also analyzed with special emphasis on the three-cross-grating interferometer.
ISSN:1559-128X
DOI:10.1364/AO.27.003025