Thickness matching in planar multilayer waveguides

A theoretical method is described from which the thickness of an arbitrary layer in a dielectric multilayer stack is determined if all other thicknesses and all refractive indices are given, such that a prescribed effective index for a given mode of the stack is obtained. The same theory can determi...

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Bibliographic Details
Published in:Applied optics (2004) 1990-05, Vol.29 (15), p.2320-2324
Main Authors: Frankena, H J, Jong, J, Oltmans, H, van Brug, H
Format: Article
Language:English
Online Access:Get full text
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Summary:A theoretical method is described from which the thickness of an arbitrary layer in a dielectric multilayer stack is determined if all other thicknesses and all refractive indices are given, such that a prescribed effective index for a given mode of the stack is obtained. The same theory can determine the optimal cover thickness of such a stack for prism coupling. Experimental verification shows effective indices that are in agreement with the designed values.
ISSN:1559-128X
DOI:10.1364/AO.29.002320