Surface enhanced ellipsometric contrast (SEEC) basic theory and lambda/4 multilayered solutions

The fundamentals of a new high contrast technique for optical microscopy, named "Surface Enhanced Ellipsometric Contrast" (SEEC), are presented. The technique is based on the association of enhancing contrast surfaces as sample stages and microscope observation between cross polarizers. Th...

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Bibliographic Details
Published in:Optics express 2007-06, Vol.15 (13), p.8329-8339
Main Authors: Ausserré, D, Valignat, M-P
Format: Article
Language:English
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Summary:The fundamentals of a new high contrast technique for optical microscopy, named "Surface Enhanced Ellipsometric Contrast" (SEEC), are presented. The technique is based on the association of enhancing contrast surfaces as sample stages and microscope observation between cross polarizers. The surfaces are designed to become anti-reflecting when used in these conditions. They are defined by the simple equation r(p) + r(s) = 0 between their two Fresnel coefficients. Most often, this equation can be met by covering a solid surface with a single lambda/4 layer with a well defined refractive index. A higher flexibility is obtained with multilayer stacks. Solutions with an arbitrary number of all-dielectric lambda/4 layers are derived.
ISSN:1094-4087
1094-4087
DOI:10.1364/OE.15.008329