Atomic Resolution Imaging and Topography of Boron Nitride Sheets Produced by Chemical Exfoliation

Here, we present a simple method for preparing thin few-layer sheets of hexagonal BN with micrometer-sized dimensions using chemical exfoliation in the solvent 1,2-dichloroethane. The atomic structure of both few-layer and monolayer BN sheets is directly imaged using aberration-corrected high-resolu...

Full description

Saved in:
Bibliographic Details
Published in:ACS nano 2010-03, Vol.4 (3), p.1299-1304
Main Authors: Warner, Jamie H, Rümmeli, Mark H, Bachmatiuk, Alicja, Büchner, Bernd
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Here, we present a simple method for preparing thin few-layer sheets of hexagonal BN with micrometer-sized dimensions using chemical exfoliation in the solvent 1,2-dichloroethane. The atomic structure of both few-layer and monolayer BN sheets is directly imaged using aberration-corrected high-resolution transmission electron microscopy. Electron beam induced sputtering effects are examined in real time. The removal of layers of BN by electron beam irradiation leads to the exposure of a step edge between a monolayer and bilayer region. We use HRTEM imaging combined with image simulations to show that BN bilayers can have AB stacking and are not limited to just AA stacking.
ISSN:1936-0851
1936-086X
DOI:10.1021/nn901648q