Scanning near‐field optical microscopy using semiconductor nanocrystals as a local fluorescence and fluorescence resonance energy transfer source

Summary Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near‐field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules inhomogeneously de...

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Bibliographic Details
Published in:Journal of microscopy (Oxford) 2003-06, Vol.210 (3), p.274-278
Main Authors: Shubeita, G. T., Sekatskii, S. K., Dietler, G., Potapova, I., Mews, A., Basché, T.
Format: Article
Language:English
Subjects:
Fluorescence resonance energy transfer
near‐field optics
semiconductor nanocrystals
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Summary:Summary Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near‐field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules inhomogeneously deposited onto a glass substrate. Thousands of nanocrystals contribute to the signal when this probe is used as a local fluorescence source while only tens of those (the most apical) are involved in imaging for the FRET SNOM operation mode. The dip‐coating method used to make the probe enables diminishing the number of active fluorescent nanocrystals easily. Prospects to realize FRET SNOM based on a single fluorescence centre using such an approach are briefly described.
ISSN:0022-2720
1365-2818
DOI:10.1046/j.1365-2818.2003.01143.x