Surface roughness measurements by means of polychromatic speckle patterns

A new method for surface roughness measurements is described based on the fibrous, roughness-dependent structure of polychromatic speckle patterns in the far field. The patterns are recorded on photographic film and analyzed by an optical Fourier transform system with a double aperture in the film p...

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Bibliographic Details
Published in:Applied optics (2004) 1979-12, Vol.18 (23), p.4051-4060
Main Author: Stansberg, C T
Format: Article
Language:English
Online Access:Get full text
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Summary:A new method for surface roughness measurements is described based on the fibrous, roughness-dependent structure of polychromatic speckle patterns in the far field. The patterns are recorded on photographic film and analyzed by an optical Fourier transform system with a double aperture in the film plane. We have calculated the theoretical roughness dependence of a parameter in the Fourier spectrum. Our experimental results agree fairly well with the theory.
ISSN:1559-128X
DOI:10.1364/AO.18.004051