Interference effects in luminescence studies of thin films

Interference effects, including multiple-beam and wide-angle, associated with luminescence from within a thin film are described. A simple geometrical model is used to calculate the s- and p-polarized luminescent light assuming electric-dipole radiation. The luminescence exhibits fringes when measur...

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Bibliographic Details
Published in:Applied optics (2004) 1982-07, Vol.21 (14), p.2512-2519
Main Authors: Holm, R T, McKnight, S W, Palik, E D, Lukosz, W
Format: Article
Language:English
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Summary:Interference effects, including multiple-beam and wide-angle, associated with luminescence from within a thin film are described. A simple geometrical model is used to calculate the s- and p-polarized luminescent light assuming electric-dipole radiation. The luminescence exhibits fringes when measured both as a function of the film thickness and as a function of the wavelength of the light. In the latter case the fringes can also show a beating effect. The model is applied to several experimental examples of cathodoluminescence in SiO(2) and an example of photoluminescence in a-Si.
ISSN:1559-128X
DOI:10.1364/AO.21.002512