Atomic force microscopy characterization of corneocytes: effect of moisturizer on their topology, rigidity, and friction

Background/purpose: Atomic force microscopy (AFM) is a novel technique for skin characterization. Objectives: To develop AFM tests for characterization of the outermost epidermis layer, corneocytes. As an example, the effect of moisturizer on the corneocyte properties is studied. Methods and materia...

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Bibliographic Details
Published in:Skin research and technology 2010-08, Vol.16 (3), p.275-282
Main Authors: Gaikwad, R. M., Vasilyev, S. I., Datta, S., Sokolov, I.
Format: Article
Language:English
Subjects:
Adult
atomic force microscopy
corneocyte
Dermoscopy - instrumentation
Dermoscopy - methods
Emollients - administration & dosage
Epidermis - cytology
Epidermis - drug effects
Forearm
Friction
Humans
Male
Microscopy, Atomic Force - instrumentation
Microscopy, Atomic Force - methods
Middle Aged
Models, Biological
skin flakes
topology
Young's modulus
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Summary:Background/purpose: Atomic force microscopy (AFM) is a novel technique for skin characterization. Objectives: To develop AFM tests for characterization of the outermost epidermis layer, corneocytes. As an example, the effect of moisturizer on the corneocyte properties is studied. Methods and materials: Topology, rigidity, and friction (between individual corneocytes and AFM probe) of the top layer of corneocytes were measured by means of Veeco DM3100 AFM. Quench™ moisturizing cream was applied daily on the forearm of five volunteers for a period of 9 days. The skin flakes were collected before and after the treatment using Cuderm tape strips. No additional treatment of flakes was performed before the measurements. Results: A protocol for the AFM study of corneocytes is developed. After the treatment, we observed overall smoothening of the corneocyte surface, an increase of friction, and a decrease of rigidity (the Young modulus). Conclusion: AFM can be used as a very sensitive tool for early detection of changes in corneocytes.
ISSN:0909-752X
1600-0846
DOI:10.1111/j.1600-0846.2010.00446.x