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Reflectometric spectroscopy of adsorbed molecular layers
A normal-incidence technique is described for obtaining IR absorption spectra of molecular layers adsorbed on a dielectric thin-film surface. In the experiment described, a low-power CO(2) laser beam is scanned across a molecular layer of 2-propanol adsorbed on a ZnSe film. Spectra for 1-5 monolayer...
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Published in: | Optics letters 1983-03, Vol.8 (3), p.151-153 |
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Format: | Article |
Language: | English |
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container_end_page | 153 |
container_issue | 3 |
container_start_page | 151 |
container_title | Optics letters |
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creator | Daneu, V Ehrlich, D J Osgood, Jr, R M |
description | A normal-incidence technique is described for obtaining IR absorption spectra of molecular layers adsorbed on a dielectric thin-film surface. In the experiment described, a low-power CO(2) laser beam is scanned across a molecular layer of 2-propanol adsorbed on a ZnSe film. Spectra for 1-5 monolayer coverages are compared with the liquid spectrum of the adsorbate. |
doi_str_mv | 10.1364/OL.8.000151 |
format | article |
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language | eng |
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source | OSA_美国光学学会数据库1 |
title | Reflectometric spectroscopy of adsorbed molecular layers |
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