SESAM: Exploring the Frontiers of Electron Microscopy

We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s expos...

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Bibliographic Details
Published in:Microscopy and microanalysis 2006-12, Vol.12 (6), p.506-514
Main Authors: Koch, Christoph T., Sigle, Wilfried, Höschen, Rainer, Rühle, Manfred, Essers, Erik, Benner, Gerd, Matijevic, Marko
Format: Article
Language:English
Subjects:
Aperture
Electron microscopes
Fourier transforms
Materials science
Optical properties
Photographic film
Transmission electron microscopy
Transmissivity
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Summary:We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 eV = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927606060624