Synchrotron study of oxygen depletion in a Bi-2212 whisker annealed at 363 K

Direct evidence is reported of structural and electronic effects induced on a single Bi2Sr2CaCu2O8+δ (Bi‐2212) whisker during a progressive annealing process. The crystal was investigated by micro X‐ray diffraction (µ‐XRD), micro X‐ray fluorescence and electrical characterization at the European Syn...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2009-11, Vol.16 (6), p.813-817
Main Authors: Cagliero, Stefano, Piovano, Andrea, Lamberti, Carlo, Rahman Khan, Mohammad Mizanur, Agostino, Angelo, Agostini, Giovanni, Gianolio, Diego, Mino, Lorenzo, Sans, Juan A., Manfredotti, Chiara, Truccato, Marco
Format: Article
Language:English
Subjects:
Bi-2212
Kirkpatrick-Baez mirrors
micro-XRD
micro-XRF
microfocused X-ray beam
oxygen doping
superconductor
THz
whisker
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Summary:Direct evidence is reported of structural and electronic effects induced on a single Bi2Sr2CaCu2O8+δ (Bi‐2212) whisker during a progressive annealing process. The crystal was investigated by micro X‐ray diffraction (µ‐XRD), micro X‐ray fluorescence and electrical characterization at the European Synchrotron Radiation Facility, during a series of three in situ thermal processes at 363 K. Each step increased the sample resistivity and decreased its critical temperature, up to a semiconducting behaviour. These data correlate with µ‐XRD analysis, which shows an increase of the c‐axis parameter from 30.56 Å to 30.75 Å, indicating an oxygen depletion mechanism. Mild temperature annealing could be an effective process to modulate the intrinsic Josephson junctions' characteristics in Bi‐2212 whiskers.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049509036802