Soft-x-ray interferometer for single-shot laser linewidth measurements

A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of...

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Bibliographic Details
Published in:Optics letters 1996-07, Vol.21 (13), p.955-957
Main Authors: Chilla, J L, Rocca, J J, Martinez, O E, Marconi, M C
Format: Article
Language:English
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Summary:A soft-x-ray Mach-Zehnder interferometer configuration that makes use of the time delay introduced by diffraction gratings to conduct single-shot measurements of the linewidth of soft-x-ray laser amplifiers is proposed and analyzed. The scheme was experimentally demonstrated in the near-IR region of the spectrum by measurement of the mode separation of a semiconductor laser. A symmetric configuration with compensated time delays that can be implemented for plasma diagnostics and for evaluating soft-x-ray optics is also discussed.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.21.000955