Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2))

Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes li...

Full description

Saved in:
Bibliographic Details
Published in:Optics letters 1997-12, Vol.22 (23), p.1808-1810
Main Authors: Jellison, Jr, G E, Modine, F A, Boatner, L A
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Two-modulator generalized ellipsometry is applied to determination of the optical functions of uniaxial rutile. For a nondepolarizing sample the two-modulator generalized ellipsometer determines all the elements of the normalized Jones matrix with one measurement and thereby totally characterizes light reflecting from the sample. If a uniaxial crystal is appropriately aligned, then determining its optical functions requires only a single measurement. We have used this new instrument to obtain optical functions of rutile that are the most accurate available for optical energies above the band edge.
ISSN:0146-9592
1539-4794
DOI:10.1364/ol.22.001808