Interferometric measurements of high temperature objects by electronic speckle pattern interferometry

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Bibliographic Details
Published in:Applied optics (2004) 1985-10, Vol.24 (19), p.3167-3167
Main Authors: Lokberg, O J, Malmo, J T, Slettemoen, G A
Format: Article
Language:English
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ISSN:1559-128X
DOI:10.1364/AO.24.003167