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Antireflection structures with use of multilevel subwavelength zero-order gratings
It is known that the zero-order two-phase-level gratings with a period much smaller and a thickness much larger than the wavelength may have antireflection properties the same as appropriate dielectric layers under normal incidence. On the basis of the rigorous coupled-wave analysis method formulati...
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Published in: | Applied optics (2004) 1997-12, Vol.36 (34), p.8935-8938 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Citations: | Items that cite this one |
Online Access: | Get full text |
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Summary: | It is known that the zero-order two-phase-level gratings with a period much smaller and a thickness much larger than the wavelength may have antireflection properties the same as appropriate dielectric layers under normal incidence. On the basis of the rigorous coupled-wave analysis method formulation, it is shown that multilevel unidimensional phase gratings, for both TE and TM polarization, are functionally equivalent to antireflection structures of multilevel dielectric layers, even if the period is close to the wavelength. |
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ISSN: | 1559-128X |
DOI: | 10.1364/AO.36.008935 |