Microchannel plate life tests

We have investigated the manner in which the gain of a microchannel plate (MCP) changes as the plate is operated at moderate output currents. We find that the total charge per unit area Q (C-cm(-2)) extracted from the MCP is the relevant quantity for evaluating the performance of the MCP. The shape...

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Published in:Applied optics (2004) 1977-05, Vol.16 (5), p.1435-1437
Main Authors: Sandel, B R, Broadfoot, A L, Shemansky, D E
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Language:English
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Broadfoot, A L
Shemansky, D E
description We have investigated the manner in which the gain of a microchannel plate (MCP) changes as the plate is operated at moderate output currents. We find that the total charge per unit area Q (C-cm(-2)) extracted from the MCP is the relevant quantity for evaluating the performance of the MCP. The shape of the gain vs Q curve may contain important information on the gain decay process. The MCP's showed no long periods of stable gain similar to those frequently exhibited by channeltrons.
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fullrecord <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_proquest_miscellaneous_734288943</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>734288943</sourcerecordid><originalsourceid>FETCH-LOGICAL-c319t-b743b02a218d0e2f0e933e565286c9c3aceafc015f56493ac374d2d8e72a05e03</originalsourceid><addsrcrecordid>eNo1jztLxEAUhadQ3HW1s1XSWSXemTvPcllcFVa2UbALk8kNRvIykxT-ewOu1eHAx3c4jN1wyDhq-bA9ZlxnAFyiOmNrrpRLubAfK3YZ4xcAKunMBVsJ4NoaLtfs9rUOYx8-fddRkwyNnyhp6oqSieIUr9h55ZtI16fcsPf949vuOT0cn15220MakLspLYzEAoQX3JZAogJyiKS0ElYHF9AH8lUAriqlpVsqGlmK0pIRHhQBbtj9n3cY--95Wc7bOgZqGt9RP8fcoBTWOokLeXci56KlMh_GuvXjT_7_CH8Bq69I3Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>734288943</pqid></control><display><type>article</type><title>Microchannel plate life tests</title><source>OSA Publishing</source><creator>Sandel, B R ; Broadfoot, A L ; Shemansky, D E</creator><creatorcontrib>Sandel, B R ; Broadfoot, A L ; Shemansky, D E</creatorcontrib><description>We have investigated the manner in which the gain of a microchannel plate (MCP) changes as the plate is operated at moderate output currents. We find that the total charge per unit area Q (C-cm(-2)) extracted from the MCP is the relevant quantity for evaluating the performance of the MCP. The shape of the gain vs Q curve may contain important information on the gain decay process. The MCP's showed no long periods of stable gain similar to those frequently exhibited by channeltrons.</description><identifier>ISSN: 1559-128X</identifier><identifier>DOI: 10.1364/AO.16.001435</identifier><identifier>PMID: 20168714</identifier><language>eng</language><publisher>United States</publisher><ispartof>Applied optics (2004), 1977-05, Vol.16 (5), p.1435-1437</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c319t-b743b02a218d0e2f0e933e565286c9c3aceafc015f56493ac374d2d8e72a05e03</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/20168714$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Sandel, B R</creatorcontrib><creatorcontrib>Broadfoot, A L</creatorcontrib><creatorcontrib>Shemansky, D E</creatorcontrib><title>Microchannel plate life tests</title><title>Applied optics (2004)</title><addtitle>Appl Opt</addtitle><description>We have investigated the manner in which the gain of a microchannel plate (MCP) changes as the plate is operated at moderate output currents. We find that the total charge per unit area Q (C-cm(-2)) extracted from the MCP is the relevant quantity for evaluating the performance of the MCP. The shape of the gain vs Q curve may contain important information on the gain decay process. The MCP's showed no long periods of stable gain similar to those frequently exhibited by channeltrons.</description><issn>1559-128X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1977</creationdate><recordtype>article</recordtype><recordid>eNo1jztLxEAUhadQ3HW1s1XSWSXemTvPcllcFVa2UbALk8kNRvIykxT-ewOu1eHAx3c4jN1wyDhq-bA9ZlxnAFyiOmNrrpRLubAfK3YZ4xcAKunMBVsJ4NoaLtfs9rUOYx8-fddRkwyNnyhp6oqSieIUr9h55ZtI16fcsPf949vuOT0cn15220MakLspLYzEAoQX3JZAogJyiKS0ElYHF9AH8lUAriqlpVsqGlmK0pIRHhQBbtj9n3cY--95Wc7bOgZqGt9RP8fcoBTWOokLeXci56KlMh_GuvXjT_7_CH8Bq69I3Q</recordid><startdate>19770501</startdate><enddate>19770501</enddate><creator>Sandel, B R</creator><creator>Broadfoot, A L</creator><creator>Shemansky, D E</creator><scope>NPM</scope><scope>7X8</scope></search><sort><creationdate>19770501</creationdate><title>Microchannel plate life tests</title><author>Sandel, B R ; Broadfoot, A L ; Shemansky, D E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c319t-b743b02a218d0e2f0e933e565286c9c3aceafc015f56493ac374d2d8e72a05e03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1977</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sandel, B R</creatorcontrib><creatorcontrib>Broadfoot, A L</creatorcontrib><creatorcontrib>Shemansky, D E</creatorcontrib><collection>PubMed</collection><collection>MEDLINE - Academic</collection><jtitle>Applied optics (2004)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sandel, B R</au><au>Broadfoot, A L</au><au>Shemansky, D E</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Microchannel plate life tests</atitle><jtitle>Applied optics (2004)</jtitle><addtitle>Appl Opt</addtitle><date>1977-05-01</date><risdate>1977</risdate><volume>16</volume><issue>5</issue><spage>1435</spage><epage>1437</epage><pages>1435-1437</pages><issn>1559-128X</issn><abstract>We have investigated the manner in which the gain of a microchannel plate (MCP) changes as the plate is operated at moderate output currents. We find that the total charge per unit area Q (C-cm(-2)) extracted from the MCP is the relevant quantity for evaluating the performance of the MCP. The shape of the gain vs Q curve may contain important information on the gain decay process. The MCP's showed no long periods of stable gain similar to those frequently exhibited by channeltrons.</abstract><cop>United States</cop><pmid>20168714</pmid><doi>10.1364/AO.16.001435</doi><tpages>3</tpages></addata></record>
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ispartof Applied optics (2004), 1977-05, Vol.16 (5), p.1435-1437
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language eng
recordid cdi_proquest_miscellaneous_734288943
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title Microchannel plate life tests
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T11%3A37%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Microchannel%20plate%20life%20tests&rft.jtitle=Applied%20optics%20(2004)&rft.au=Sandel,%20B%20R&rft.date=1977-05-01&rft.volume=16&rft.issue=5&rft.spage=1435&rft.epage=1437&rft.pages=1435-1437&rft.issn=1559-128X&rft_id=info:doi/10.1364/AO.16.001435&rft_dat=%3Cproquest_pubme%3E734288943%3C/proquest_pubme%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c319t-b743b02a218d0e2f0e933e565286c9c3aceafc015f56493ac374d2d8e72a05e03%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=734288943&rft_id=info:pmid/20168714&rfr_iscdi=true