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Design and Characterization of Fabry–Pérot MEMS-Based Short-Wave Infrared Microspectrometers
Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry–Pérot filter and a Hg x Cd 1– x Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5 μ m to 2.6 μ m wavelength range....
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Published in: | Journal of electronic materials 2008-12, Vol.37 (12), p.1811-1820 |
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Main Authors: | , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Microspectrometers based on the monolithic integration of a microelectromechanical system (MEMS) Fabry–Pérot filter and a Hg
x
Cd
1–
x
Te-based infrared detector are discussed and measured results presented. The microspectrometers are designed to operate in the 1.5
μ
m to 2.6
μ
m wavelength range. Design equations are presented which account for the mechanical and optical characteristics of the device. Measurements indicate linewidths as narrow as 55 nm, switching times of 40
μ
s, and a tuning range of 380 nm, which is limited by snap-down. Optical characterization of the distributed Bragg mirrors and the Fabry–Pérot filter are presented, and these are shown to be in good agreement with simple first-order analytical models. Bowing of the movable Fabry–Pérot mirror due to stress gradients is identified as the dominant source of linewidth broadening. |
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ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-008-0526-0 |