Loading…
Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Elastic and Inelastic Scattering in Electron Diffraction and Imaging by Zhong Lin Wang.
Saved in:
Published in: | American Scientist 1996, Vol.84 (4), p.406-407 |
---|---|
Main Author: | |
Format: | Review |
Language: | English |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 407 |
container_issue | 4 |
container_start_page | 406 |
container_title | American Scientist |
container_volume | 84 |
creator | Hren, John J. |
description | Elastic and Inelastic Scattering in Electron Diffraction and Imaging by Zhong Lin Wang. |
format | review |
fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_miscellaneous_743270879</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A18448238</galeid><jstor_id>29775729</jstor_id><sourcerecordid>A18448238</sourcerecordid><originalsourceid>FETCH-LOGICAL-g4209-9e7c868e3f34bf7603189e9b85d1c06394a807469552c4421574d48b9127970c3</originalsourceid><addsrcrecordid>eNqN0l1rWyEYB_DDWGFZ249QOOxmY_SAx5ejXmZplgVCA329FGOeczAYT6cG1m9f1wbWlKwEL_SRn38exQ_FoGaUVZiL5mMxQAiRCknZfCo-x7hCqK4lI4PiYux0TNaU2i_LqYdtdW10ShCs70rry7EDk0LvywvbtkGbZPP6-cBad9mcFEetdhFOt_NxcftzfDP6Vc3mk-loOKs6ipGsJHAjGgGkJXTR8gaRWkiQC8GWtUENkVQLxGkjGcOGUlwzTpdULGSNueTIkOPi60vuQ-h_byAmtbbRgHPaQ7-JilOCORJcZvnljVz1m-BzcyrH4oYJzP6hTjtQ1rd9ypf7G6mGtaBUYCIyOt-DOvAQtOs9tDZvv-bVHp7HEtbW7PPfdnwmCf6kTm9iVNPrq8Pp5cF0fncw_THZod__T4c396ODWxCT2TtPvKWmdw46UPkLjeY7_OyFr2Lqg3oIdq3Do8KSc8axJE96gubB</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>review</recordtype><pqid>215265825</pqid></control><display><type>review</type><title>Elastic and Inelastic Scattering in Electron Diffraction and Imaging</title><source>JSTOR Archival Journals and Primary Sources Collection</source><creator>Hren, John J.</creator><creatorcontrib>Hren, John J.</creatorcontrib><description>Elastic and Inelastic Scattering in Electron Diffraction and Imaging by Zhong Lin Wang.</description><identifier>ISSN: 0003-0996</identifier><identifier>EISSN: 1545-2786</identifier><identifier>CODEN: AMSCAC</identifier><language>eng</language><publisher>Research Triangle Park: Sigma Xi Scientific Research Society</publisher><subject>Electrons ; ENGINEERING AND APPLIED sciences ; Microscopes ; Nonfiction ; Scientific imaging</subject><ispartof>American Scientist, 1996, Vol.84 (4), p.406-407</ispartof><rights>Copyright © 1996 Sigma Xi, The Scientific Research Society, Inc.</rights><rights>COPYRIGHT 1996 Sigma Xi, The Scientific Research Society</rights><rights>Copyright Sigma XI-The Scientific Research Society Jul/Aug 1996</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.jstor.org/stable/pdf/29775729$$EPDF$$P50$$Gjstor$$H</linktopdf><linktohtml>$$Uhttps://www.jstor.org/stable/29775729$$EHTML$$P50$$Gjstor$$H</linktohtml><link.rule.ids>313,314,780,784,792,58238,58471</link.rule.ids></links><search><creatorcontrib>Hren, John J.</creatorcontrib><title>Elastic and Inelastic Scattering in Electron Diffraction and Imaging</title><title>American Scientist</title><addtitle>American Scientist</addtitle><description>Elastic and Inelastic Scattering in Electron Diffraction and Imaging by Zhong Lin Wang.</description><subject>Electrons</subject><subject>ENGINEERING AND APPLIED sciences</subject><subject>Microscopes</subject><subject>Nonfiction</subject><subject>Scientific imaging</subject><issn>0003-0996</issn><issn>1545-2786</issn><fulltext>true</fulltext><rsrctype>review</rsrctype><creationdate>1996</creationdate><recordtype>review</recordtype><recordid>eNqN0l1rWyEYB_DDWGFZ249QOOxmY_SAx5ejXmZplgVCA329FGOeczAYT6cG1m9f1wbWlKwEL_SRn38exQ_FoGaUVZiL5mMxQAiRCknZfCo-x7hCqK4lI4PiYux0TNaU2i_LqYdtdW10ShCs70rry7EDk0LvywvbtkGbZPP6-cBad9mcFEetdhFOt_NxcftzfDP6Vc3mk-loOKs6ipGsJHAjGgGkJXTR8gaRWkiQC8GWtUENkVQLxGkjGcOGUlwzTpdULGSNueTIkOPi60vuQ-h_byAmtbbRgHPaQ7-JilOCORJcZvnljVz1m-BzcyrH4oYJzP6hTjtQ1rd9ypf7G6mGtaBUYCIyOt-DOvAQtOs9tDZvv-bVHp7HEtbW7PPfdnwmCf6kTm9iVNPrq8Pp5cF0fncw_THZod__T4c396ODWxCT2TtPvKWmdw46UPkLjeY7_OyFr2Lqg3oIdq3Do8KSc8axJE96gubB</recordid><startdate>19960701</startdate><enddate>19960701</enddate><creator>Hren, John J.</creator><general>Sigma Xi Scientific Research Society</general><general>Sigma Xi, The Scientific Research Society</general><general>Sigma XI-The Scientific Research Society</general><scope>8GL</scope><scope>ATWCN</scope><scope>IOV</scope><scope>ISN</scope><scope>ISR</scope><scope>3V.</scope><scope>7QG</scope><scope>7QL</scope><scope>7SC</scope><scope>7SN</scope><scope>7SP</scope><scope>7SR</scope><scope>7SS</scope><scope>7TB</scope><scope>7TK</scope><scope>7U5</scope><scope>7X2</scope><scope>7X7</scope><scope>7XB</scope><scope>88A</scope><scope>88E</scope><scope>88I</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>ATCPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>BKSAR</scope><scope>C1K</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>JQ2</scope><scope>K9.</scope><scope>KB.</scope><scope>KR7</scope><scope>L6V</scope><scope>L7M</scope><scope>LK8</scope><scope>L~C</scope><scope>L~D</scope><scope>M0K</scope><scope>M0S</scope><scope>M1P</scope><scope>M2O</scope><scope>M2P</scope><scope>M7P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PATMY</scope><scope>PCBAR</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>PYCSY</scope><scope>Q9U</scope><scope>R05</scope><scope>S0X</scope></search><sort><creationdate>19960701</creationdate><title>Elastic and Inelastic Scattering in Electron Diffraction and Imaging</title><author>Hren, John J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-g4209-9e7c868e3f34bf7603189e9b85d1c06394a807469552c4421574d48b9127970c3</frbrgroupid><rsrctype>reviews</rsrctype><prefilter>reviews</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Electrons</topic><topic>ENGINEERING AND APPLIED sciences</topic><topic>Microscopes</topic><topic>Nonfiction</topic><topic>Scientific imaging</topic><toplevel>online_resources</toplevel><creatorcontrib>Hren, John J.</creatorcontrib><collection>Gale In Context: High School</collection><collection>Gale In Context: Middle School</collection><collection>Gale In Context: Opposing Viewpoints</collection><collection>Gale In Context: Canada</collection><collection>Gale In Context: Science</collection><collection>ProQuest Central (Corporate)</collection><collection>Animal Behavior Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Computer and Information Systems Abstracts</collection><collection>Ecology Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Entomology Abstracts (Full archive)</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Neurosciences Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Agricultural Science Collection</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Biology Database (Alumni Edition)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Database (1962 - current)</collection><collection>Agricultural & Environmental Science Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>eLibrary</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Earth, Atmospheric & Aquatic Science Collection</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Materials Science Database</collection><collection>Civil Engineering Abstracts</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ProQuest Biological Science Collection</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Agriculture Science Database</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>ProQuest Research Library</collection><collection>ProQuest Science Journals</collection><collection>Biological Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>ProQuest advanced technologies & aerospace journals</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Environmental Science Database</collection><collection>Earth, Atmospheric & Aquatic Science Database</collection><collection>Materials science collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering collection</collection><collection>Environmental Science Collection</collection><collection>ProQuest Central Basic</collection><collection>University of Michigan</collection><collection>SIRS Editorial</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Hren, John J.</au><format>journal</format><genre>article</genre><ristype>GEN</ristype><atitle>Elastic and Inelastic Scattering in Electron Diffraction and Imaging</atitle><jtitle>American Scientist</jtitle><addtitle>American Scientist</addtitle><date>1996-07-01</date><risdate>1996</risdate><volume>84</volume><issue>4</issue><spage>406</spage><epage>407</epage><pages>406-407</pages><issn>0003-0996</issn><eissn>1545-2786</eissn><coden>AMSCAC</coden><abstract>Elastic and Inelastic Scattering in Electron Diffraction and Imaging by Zhong Lin Wang.</abstract><cop>Research Triangle Park</cop><pub>Sigma Xi Scientific Research Society</pub><tpages>2</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0003-0996 |
ispartof | American Scientist, 1996, Vol.84 (4), p.406-407 |
issn | 0003-0996 1545-2786 |
language | eng |
recordid | cdi_proquest_miscellaneous_743270879 |
source | JSTOR Archival Journals and Primary Sources Collection |
subjects | Electrons ENGINEERING AND APPLIED sciences Microscopes Nonfiction Scientific imaging |
title | Elastic and Inelastic Scattering in Electron Diffraction and Imaging |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T20%3A08%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Elastic%20and%20Inelastic%20Scattering%20in%20Electron%20Diffraction%20and%20Imaging&rft.jtitle=American%20Scientist&rft.au=Hren,%20John%20J.&rft.date=1996-07-01&rft.volume=84&rft.issue=4&rft.spage=406&rft.epage=407&rft.pages=406-407&rft.issn=0003-0996&rft.eissn=1545-2786&rft.coden=AMSCAC&rft_id=info:doi/&rft_dat=%3Cgale_proqu%3EA18448238%3C/gale_proqu%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-g4209-9e7c868e3f34bf7603189e9b85d1c06394a807469552c4421574d48b9127970c3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=215265825&rft_id=info:pmid/&rft_galeid=A18448238&rft_jstor_id=29775729&rfr_iscdi=true |