Modelling of optical properties of amorphous selenium thin films

The investigated amorphous selenium (a-Se) films of different thicknesses (100–385 nm) were deposited by vacuum evaporation technique in a base pressure of 7.5×10 −6 torr at room temperature. The transmission spectra T( λ) of the a-Se films were measured over a wide range of wavelengths from 200 to...

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Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 2010-02, Vol.405 (4), p.1101-1107
Main Authors: Solieman, A., Abu-Sehly, A.A.
Format: Article
Language:English
Subjects:
Amorphous selenium
Amorphous semiconductors
glasses
Bandgap energy
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Dielectric function
Exact sciences and technology
OJL model
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
Thickness
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Summary:The investigated amorphous selenium (a-Se) films of different thicknesses (100–385 nm) were deposited by vacuum evaporation technique in a base pressure of 7.5×10 −6 torr at room temperature. The transmission spectra T( λ) of the a-Se films were measured over a wide range of wavelengths from 200 to 2500 nm. The measured spectra were analyzed by applying O’Leary, Johnson, Lim (OJL) model. The photon energy dependence of the dielectric function, ε= ε 1+ iε 2, of the investigated a-Se films was obtained. The film thickness, absorption coefficient α, refractive index n, high frequency dielectric constant ε ∞ and optical band gap Eg have been deduced. Increasing the film thickness was found to increase the refractive index and optical band gap energy.
ISSN:0921-4526
1873-2135
DOI:10.1016/j.physb.2009.11.014