Influence of external magnetic field on magnon–plasmon polaritons in negative-index antiferromagnet–semiconductor superlattices

• Published in: Journal of magnetism and magnetic materials 2010-03, Vol.322 (6), p.603-608
• Main Authors: Tarkhanyan, R.H., Niarchos, D.G., Kafesaki, M.
• Format: Article
• Language: English
• Subjects: Antiferromagnet; Collective excitations (including excitons, polarons, plasmons and other charge-density excitations); Condensed matter: electronic structure, electrical, magnetic, and optical properties; Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Exact sciences and technology; Magnon–plasmon polaritons; Negative refraction; Physics; Semiconductor; Superlattice; Surface and interface electron states
• ISSN: 0304-8853
• DOI: 10.1016/j.jmmm.2009.10.023

The peculiarities of the negative refraction in periodic multilayered antiferromagnet–semiconductor nanostructures are investigated in the presence of an external magnetic field parallel to the plane of the layers. Effective material tensors are obtained using method of anisotropic homogeneous medium. Dispersion and energetic relations for the mixed magnon–plasmon polaritons are investigated in the case of the Voigt geometry. Frequency regions of anomalous dispersion are found and studied in various regimes of the applied magnetic field. The necessary conditions are found under which the structure behaves as a left-handed negative-index metamaterial. Analytical expressions for the frequency-dependent phase and group refractive indices are obtained.