Correlation between Thickness, Conductivity and Thermal Degradation Mechanisms of PEDOT:PSS Films

D.c. conductivity s and thermal degradation measurements on PEDOT:PSS films of different thicknesses d = 50, 120 and 180 nm are reported. The experimental results are consistent with a hopping type carrier transport. For the films with thickness d = 50 nm, which consist of almost one single layer of...

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Main Authors: Vitoratos, E, Sakkopoulos, S, Dalas, E, Paliatsas, N, Emmanouil, K, Malkaf, P, Choulis, S A
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Sakkopoulos, S
Dalas, E
Paliatsas, N
Emmanouil, K
Malkaf, P
Choulis, S A
description D.c. conductivity s and thermal degradation measurements on PEDOT:PSS films of different thicknesses d = 50, 120 and 180 nm are reported. The experimental results are consistent with a hopping type carrier transport. For the films with thickness d = 50 nm, which consist of almost one single layer of PEDOT:PSS conductive grains, the conductivity and the heat aging are consistent with a hopping transport in a granular metal type structure. However, for films with d = 120 and 180 nm, in which many conductive grains constitute the film thickness, a completely different behaviour is exhibited. An explanation of this is proposed.
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title Correlation between Thickness, Conductivity and Thermal Degradation Mechanisms of PEDOT:PSS Films
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