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Quantum-Well States as Fabry-Pérot Modes in a Thin-Film Electron Interferometer
Angle-resolved photoemission from atomically uniform silver films on iron (100) shows quantum-well states for absolutely determined film thicknesses ranging from 1 to ∼100 monolayers. These states can be understood in terms of Fabry-Pérot modes in an electron interferometer. A quantitative line shap...
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Published in: | Science (American Association for the Advancement of Science) 1999-03, Vol.283 (5408), p.1709-1711 |
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container_issue | 5408 |
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container_title | Science (American Association for the Advancement of Science) |
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creator | Paggel, J. J. Miller, T. T.-C. Chiang |
description | Angle-resolved photoemission from atomically uniform silver films on iron (100) shows quantum-well states for absolutely determined film thicknesses ranging from 1 to ∼100 monolayers. These states can be understood in terms of Fabry-Pérot modes in an electron interferometer. A quantitative line shape analysis over the entire two orders of magnitude of thickness range yields an accurate measurement of the band structure, quasiparticle lifetime, electron reflectivity, and phase shift. Effects of confinement energy gap, reflection loss, and surface scattering caused by controlled roughness are demonstrated. |
doi_str_mv | 10.1126/science.283.5408.1709 |
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Effects of confinement energy gap, reflection loss, and surface scattering caused by controlled roughness are demonstrated.</description><subject>Binding energy</subject><subject>Capture</subject><subject>Conceptual Tempo</subject><subject>Electron capture</subject><subject>Electron, ion spectrometers and related techniques</subject><subject>Electrons</subject><subject>Exact sciences and technology</subject><subject>Film thickness</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Interferometers</subject><subject>Iron</subject><subject>Material films</subject><subject>Numbers</subject><subject>Phase shift</subject><subject>Photoelectric emission</subject><subject>Physics</subject><subject>Quantum Mechanics</subject><subject>Quantum theory</subject><subject>Quantum wells</subject><subject>Quasiparticles</subject><subject>Reflectance</subject><issn>0036-8075</issn><issn>1095-9203</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1999</creationdate><recordtype>article</recordtype><sourceid>ALSLI</sourceid><sourceid>CJNVE</sourceid><sourceid>M0P</sourceid><recordid>eNqN0lFv0zAQAGALgVhX-AeAIoTEHpZix3FsP45qLZUKHdqAx8hxLiVVYg_bkbafxO_gj2HUAiqqUOUHW3efTne2EXpO8ISQrHjjdQtGwyQTdMJyLCaEY_kAjQiWLJUZpg_RCGNapAJzdoJOvd9gHHOSPkYnBGNOJcUjdPVxUCYMffoFui65DiqAT5RPZqpy9-nVj-_OhuS9rWO0NYlKbr62Jp21XZ9cdqCDsyZZmACuAWd7iIcn6FGjOg9Pd_sYfZpd3kzfpcvVfDG9WKbr2EJIK4YLknPJSc0aoTHnddGILGN1bF1UmuIsk5JLrBnJqFA1rSiuADe6ElAUio7R623dW2e_DeBD2bdexyGUATv4kueU05wIHuXZfyURTGaSCkwiffkP3djBmThHmRHKWFHEZsbofIvWqoOyNY0NTuk1GHCqswaaNoYvWM4JoURGnh7gcdXQt_qQP9vzkQS4C2s1eF8urj8cTVefj6Zv58dSMV_u0fNDVNuugzWU8cGnqz3-Yne9Q9VDXd66tlfuvvz9HSN4tQPKa9U1Thnd-r9OUEGLX3WebdnGB-v-pDMhOcM5_QmBJ_I-</recordid><startdate>19990312</startdate><enddate>19990312</enddate><creator>Paggel, J. 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J.</au><au>Miller, T.</au><au>T.-C. Chiang</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Quantum-Well States as Fabry-Pérot Modes in a Thin-Film Electron Interferometer</atitle><jtitle>Science (American Association for the Advancement of Science)</jtitle><addtitle>Science</addtitle><date>1999-03-12</date><risdate>1999</risdate><volume>283</volume><issue>5408</issue><spage>1709</spage><epage>1711</epage><pages>1709-1711</pages><issn>0036-8075</issn><eissn>1095-9203</eissn><coden>SCIEAS</coden><abstract>Angle-resolved photoemission from atomically uniform silver films on iron (100) shows quantum-well states for absolutely determined film thicknesses ranging from 1 to ∼100 monolayers. These states can be understood in terms of Fabry-Pérot modes in an electron interferometer. A quantitative line shape analysis over the entire two orders of magnitude of thickness range yields an accurate measurement of the band structure, quasiparticle lifetime, electron reflectivity, and phase shift. Effects of confinement energy gap, reflection loss, and surface scattering caused by controlled roughness are demonstrated.</abstract><cop>Washington, DC</cop><pub>American Society for the Advancement of Science</pub><pmid>10073930</pmid><doi>10.1126/science.283.5408.1709</doi><tpages>3</tpages></addata></record> |
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subjects | Binding energy Capture Conceptual Tempo Electron capture Electron, ion spectrometers and related techniques Electrons Exact sciences and technology Film thickness Instruments, apparatus, components and techniques common to several branches of physics and astronomy Interferometers Iron Material films Numbers Phase shift Photoelectric emission Physics Quantum Mechanics Quantum theory Quantum wells Quasiparticles Reflectance |
title | Quantum-Well States as Fabry-Pérot Modes in a Thin-Film Electron Interferometer |
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