Transmission Electron Microscopy: A Textbook for Materials Science

"Transmission Electron Microscopy: A Textbook for Materials Science" by David B. Williams and C. Barry Carter is reviewed.

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Published in:American Scientist 1998, Vol.86 (1), p.96-96
Main Author: Hren, John J.
Format: Review
Language:English
Subjects:
ENGINEERING AND APPLIED sciences
Materials science
Nonfiction
Scientific imaging
Textbooks
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container_title American Scientist
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creator Hren, John J.
description "Transmission Electron Microscopy: A Textbook for Materials Science" by David B. Williams and C. Barry Carter is reviewed.
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ispartof American Scientist, 1998, Vol.86 (1), p.96-96
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recordid cdi_proquest_miscellaneous_743772903
source JSTOR Archival Journals and Primary Sources Collection
subjects ENGINEERING AND APPLIED sciences
Materials science
Nonfiction
Scientific imaging
Textbooks
title Transmission Electron Microscopy: A Textbook for Materials Science
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