X-ray spectromicroscopy in soil and environmental sciences

X‐ray microscopy is capable of imaging particles in the nanometer size range directly with sub‐micrometer spatial resolution and can be combined with high spectral resolution for spectromicroscopy studies. Two types of microscopes are common in X‐ray microscopy: the transmission X‐ray microscope and...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2010-03, Vol.17 (2), p.149-157
Main Authors: Thieme, J., Sedlmair, J., Gleber, S.-C., Prietzel, J., Coates, J., Eusterhues, K., Abbt-Braun, G., Salome, M.
Format: Article
Language:English
Subjects:
colloids
Cryoelectron Microscopy - methods
Ecology
environmental sciences
Microscopy - instrumentation
Microscopy, Electron, Transmission
nanoparticles
NEXAFS
Soil - analysis
Spectrometry, X-Ray Emission - methods
spectromicroscopy
X-ray microscopy
XANES
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Summary:X‐ray microscopy is capable of imaging particles in the nanometer size range directly with sub‐micrometer spatial resolution and can be combined with high spectral resolution for spectromicroscopy studies. Two types of microscopes are common in X‐ray microscopy: the transmission X‐ray microscope and the scanning transmission X‐ray microscope; their set‐ups are explained in this paper. While the former takes high‐resolution images from an object with exposure times of seconds or faster, the latter is very well suited as an analytical instrument for spectromicroscopy. The morphology of clusters or particles from soil and sediment samples has been visualized using a transmission X‐ray microscope. Images are shown from a cryo‐tomography experiment based on X‐ray microscopy images to obtain information about the three‐dimensional structure of clusters of humic substances. The analysis of a stack of images taken with a scanning transmission X‐ray microscope to combine morphology and chemistry within a soil sample is shown. X‐ray fluorescence is a method ideally applicable to the study of elemental distributions and binding states of elements even on a trace level using X‐ray energies above 1 keV.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049509049905