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Properties of CuInS sub(2) thin films grown by a two-step process without H sub(2)S
CuInS sub(2) thin films were prepared by sulfurization of sequentially deposited Cu/In stacks with elemental sulfur. Precursors as well as reacted films are characterized by scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX) and X-ray diffraction (XRD). Excess copper is requi...
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Published in: | Solar energy materials and solar cells 1997-12, Vol.49 (1-4), p.349-356 |
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Main Authors: | , , , , , , , , , , , , , , |
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container_title | Solar energy materials and solar cells |
container_volume | 49 |
creator | Klenk, R Blieske, U Dieterle, V Ellmer, K Fiechter, S Hengel, I Jaeger-Waldau, A Kampschulte, T Kaufmann, Ch Klaer, J Lux-Steiner, M Ch Braunger, D Hariskos, D Ruckh, M Schock, H W |
description | CuInS sub(2) thin films were prepared by sulfurization of sequentially deposited Cu/In stacks with elemental sulfur. Precursors as well as reacted films are characterized by scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX) and X-ray diffraction (XRD). Excess copper is required for optimum properties and leads to a CuS secondary phase segregated at the surface. Stoichiometry is regained by etching after which heterojunctions are formed by deposition of a CdS/ZnO window layer. An active area efficiency of 10.4% has been achieved. |
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source | Elsevier |
subjects | Chemical operations Deposition Phase separation Scanning electron microscopy Semiconductor growth Stoichiometry Sulfur Thin films X ray analysis X ray diffraction analysis |
title | Properties of CuInS sub(2) thin films grown by a two-step process without H sub(2)S |
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