X-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and x-ray diffraction characterization of CuO-TiO sub(2)-CeO sub(2) catalyst system

X ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) techniques were used to charactorize the surface composition and structure of a series of CuO-TiO sub(2)-CeO sub(2) catalyst system. The amount of observed phase was found to be dependent on the s...

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Bibliographic Details
Published in:Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2001-01, Vol.19 (4), p.1150-1157
Main Authors: Francisco, MSP, Nascente, PAP, Mastelaro, V R, Florentino, A O
Format: Article
Language:English
Subjects:
Agglomeration
Binding energy
Cerium compounds
Copper oxides
Crystallization
Dispersions
Electron energy levels
Phase transitions
Surface structure
Titanium oxides
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Summary:X ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS) techniques were used to charactorize the surface composition and structure of a series of CuO-TiO sub(2)-CeO sub(2) catalyst system. The amount of observed phase was found to be dependent on the support composition but independent of copper content. A distorted local order of copper shell was observed due to the presence of Ti and Ce. The copper dispersion on the mixed surface was found to be independent of cerium concentration but dependent on the cerium species. A decrease in surface area of titanium oxide and a species with higher binding energy was observed with increase in cerium concentration.
ISSN:0734-2101