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Investigation of unusual shunting behavior due to phototransistor effect in n-type aluminum-alloyed rear junction solar cells
N-type silicon wafers have been found to offer numerous advantages over p-type silicon wafers, such that they are becoming more widely used for manufacturing high-efficiency commercial solar cells. This paper focuses on work done on n-type cell structures with a screen-printed aluminum-alloyed rear...
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Published in: | Solar energy materials and solar cells 2009-11, Vol.93 (11), p.1986-1993 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | N-type silicon wafers have been found to offer numerous advantages over
p-type silicon wafers, such that they are becoming more widely used for manufacturing high-efficiency commercial solar cells. This paper focuses on work done on
n-type cell structures with a screen-printed aluminum-alloyed rear junction, laser-doped selective emitter and light-induced plated front contacts to suit large-scale commercial production. However, with such a cell structure we report unusual linear shunting behavior that is only present under illumination but disappears under dark conditions. It was shown that such a phenomenon can be represented by a phototransistor model. In fact, such shunting effects are found to have detrimental impacts on the cell short-circuit current density (
J
sc
) and fill factor (
FF), which limits the efficiency of cells in this work to 12%. |
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ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/j.solmat.2009.07.018 |