Crop residue estimation using multiband reflectance

Soil erosion is very dependent on the protection effect of residue cover. We investigated how remote sensing could be used to estimate the crop residue cover fraction. Laboratory reflectance meas-terements performed over corn residues in various moisture levels show that, for any two wave bands, a r...

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Bibliographic Details
Published in:Remote sensing of environment 1997-03, Vol.59 (3), p.530-536
Main Authors: Biard, F., Baret, Frédéric
Format: Article
Language:English
Subjects:
Algorithms
Applied geophysics
CROP RESIDUES
CROPS
CULTIVOS
Earth sciences
Earth, ocean, space
Erosion
Exact sciences and technology
Infrared imaging
Internal geophysics
Multispectral scanners
PLANTE DE CULTURE
REFLECTANCE
REFLECTANCIA
Reflectometers
RESIDU DE RECOLTE
RESIDUOS DE COSECHAS
Soils
Surficial geology
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Summary:Soil erosion is very dependent on the protection effect of residue cover. We investigated how remote sensing could be used to estimate the crop residue cover fraction. Laboratory reflectance meas-terements performed over corn residues in various moisture levels show that, for any two wave bands, a residue line similar to that for bare soils can be defined. However, it depends on the aging state of the residues, particularly in the near-infrared and middle-infrared domains. Field reflectance measurements perfornaed over a range of crop cover fraction and soil backgrounds show that a linear mixing inodel accurately describes the reflectance of the soil residue complex. An algorithm called CRIM (crop residue index multiband) is proposed. It is based on the linear mixing model of the soil-residue complex and on. soil and residue lines. It can be used with any set of wave bands. Comparison with field -measurements performed in Thematic Mapper (TM) bands TM2, TM3, TM3, TM4, and TM5 shows reasonably good estimates of the crop residue cover fraction compared with previously proposed indices (Normalized Difference Index and Soil Adjusted Corn Residue Index). The CRIM is a linear algorithm that is resistant to any linear transforms of the reflectance. It can therefore be used with. ground-level reflectance, satellite radiance, or digital counts and should not strongly depend on. view or sun geometry or on the spatial scale. The conditions for the CRIM computation and limits of its use are discussed.
ISSN:0034-4257
1879-0704
DOI:10.1016/S0034-4257(96)00125-3