EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures

The aim of this work is the quantitative chemical analysis of polycrystalline silicon thin films grown on glass substrates at temperatures

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Bibliographic Details
Published in:Solar energy materials and solar cells 2000-07, Vol.63 (2), p.177-184
Main Authors: Stöger, Michael, Nelhiebel, Michael, Schattschneider, Peter, Schlosser, Viktor, Breymesser, Alexander, Jouffrey, Bernard
Format: Article
Language:English
Subjects:
Applied sciences
Chemical vapour deposition
Electron energy loss spectroscopy
Electron energy-loss spectrometry
Energy
Exact sciences and technology
Grain size and shape
Morphology
Natural energy
Photovoltaic conversion
Polycrystalline materials
Polycrystalline silicon thin films
Semiconducting films
Semiconducting glass
Semiconductor growth
Solar cells. Photoelectrochemical cells
Solar energy
Substrates
Thin films
Transmission electron microscopy
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Description
Summary:The aim of this work is the quantitative chemical analysis of polycrystalline silicon thin films grown on glass substrates at temperatures
ISSN:0927-0248
1879-3398
DOI:10.1016/S0927-0248(99)00172-5