Loading…
EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures
The aim of this work is the quantitative chemical analysis of polycrystalline silicon thin films grown on glass substrates at temperatures
Saved in:
| Published in: | Solar energy materials and solar cells 2000-07, Vol.63 (2), p.177-184 |
|---|---|
| Main Authors: | , , , , , |
| Format: | Article |
| Language: | English |
| Subjects: | |
| Citations: | Items that this one cites Items that cite this one |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| cited_by | cdi_FETCH-LOGICAL-c430t-7a54165b3ca07b7514947b52862a30186fff9e8a29e2b9f903bbab8e7d830a963 |
|---|---|
| cites | cdi_FETCH-LOGICAL-c430t-7a54165b3ca07b7514947b52862a30186fff9e8a29e2b9f903bbab8e7d830a963 |
| container_end_page | 184 |
| container_issue | 2 |
| container_start_page | 177 |
| container_title | Solar energy materials and solar cells |
| container_volume | 63 |
| creator | Stöger, Michael Nelhiebel, Michael Schattschneider, Peter Schlosser, Viktor Breymesser, Alexander Jouffrey, Bernard |
| description | The aim of this work is the quantitative chemical analysis of polycrystalline silicon thin films grown on glass substrates at temperatures |
| doi_str_mv | 10.1016/S0927-0248(99)00172-5 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_746166384</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0927024899001725</els_id><sourcerecordid>27564472</sourcerecordid><originalsourceid>FETCH-LOGICAL-c430t-7a54165b3ca07b7514947b52862a30186fff9e8a29e2b9f903bbab8e7d830a963</originalsourceid><addsrcrecordid>eNqNkctuFDEQRS0EEkPgE5C8QDwWTfxqP1YoigaINBKLhLVV7bHByN0eXD1E8_f0ZCLYQVa1ObduqQ4hLzl7zxnX59fMCdMxoexb594xxo3o-kdkxa1xnZTOPiarP8hT8gzxB2NMaKlWZFivN9d0zKFVmKAcMCOtie5qOYR2wBlKyVOkmEsOdaLz9zzRlMuINNVGsRZoNMRSkH5r9XaiMNNSb-kcx11sMO9bxOfkSYKC8cX9PCNfP65vLj93my-fri4vNl1Qks2dgV5x3Q8yADOD6blyygy9sFqAZNzqlJKLFoSLYnDJMTkMMNhotlYycFqekTenvbtWf-4jzn7MeLwNplj36I3SXGtp1UK-_icpTK-VMuJhoHT9AvYncPkjYovJ71oeoR08Z_4oyd9J8kcD3jl_J8kfc6_uCwADlNRgChn_hhVTztgF-3DC4vK_Xzk2jyHHKcRtbjHMflvzf4p-A2OhpmY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27564395</pqid></control><display><type>article</type><title>EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures</title><source>ScienceDirect Journals</source><creator>Stöger, Michael ; Nelhiebel, Michael ; Schattschneider, Peter ; Schlosser, Viktor ; Breymesser, Alexander ; Jouffrey, Bernard</creator><creatorcontrib>Stöger, Michael ; Nelhiebel, Michael ; Schattschneider, Peter ; Schlosser, Viktor ; Breymesser, Alexander ; Jouffrey, Bernard</creatorcontrib><description>The aim of this work is the quantitative chemical analysis of polycrystalline silicon thin films grown on glass substrates at temperatures <600°C by means of transmission electron microscopy (TEM) and electron energy-loss spectrometry (EELS). Specimens produced with two different methods were investigated. We found significant differences in grain size and morphology, as well as in the distribution of oxygen. A surprisingly high amount of Ba diffusion from the subtrate was detected.</description><identifier>ISSN: 0927-0248</identifier><identifier>EISSN: 1879-3398</identifier><identifier>DOI: 10.1016/S0927-0248(99)00172-5</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Applied sciences ; Chemical vapour deposition ; Electron energy loss spectroscopy ; Electron energy-loss spectrometry ; Energy ; Exact sciences and technology ; Grain size and shape ; Morphology ; Natural energy ; Photovoltaic conversion ; Polycrystalline materials ; Polycrystalline silicon thin films ; Semiconducting films ; Semiconducting glass ; Semiconductor growth ; Solar cells. Photoelectrochemical cells ; Solar energy ; Substrates ; Thin films ; Transmission electron microscopy</subject><ispartof>Solar energy materials and solar cells, 2000-07, Vol.63 (2), p.177-184</ispartof><rights>2000</rights><rights>2000 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c430t-7a54165b3ca07b7514947b52862a30186fff9e8a29e2b9f903bbab8e7d830a963</citedby><cites>FETCH-LOGICAL-c430t-7a54165b3ca07b7514947b52862a30186fff9e8a29e2b9f903bbab8e7d830a963</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1404978$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Stöger, Michael</creatorcontrib><creatorcontrib>Nelhiebel, Michael</creatorcontrib><creatorcontrib>Schattschneider, Peter</creatorcontrib><creatorcontrib>Schlosser, Viktor</creatorcontrib><creatorcontrib>Breymesser, Alexander</creatorcontrib><creatorcontrib>Jouffrey, Bernard</creatorcontrib><title>EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures</title><title>Solar energy materials and solar cells</title><description>The aim of this work is the quantitative chemical analysis of polycrystalline silicon thin films grown on glass substrates at temperatures <600°C by means of transmission electron microscopy (TEM) and electron energy-loss spectrometry (EELS). Specimens produced with two different methods were investigated. We found significant differences in grain size and morphology, as well as in the distribution of oxygen. A surprisingly high amount of Ba diffusion from the subtrate was detected.</description><subject>Applied sciences</subject><subject>Chemical vapour deposition</subject><subject>Electron energy loss spectroscopy</subject><subject>Electron energy-loss spectrometry</subject><subject>Energy</subject><subject>Exact sciences and technology</subject><subject>Grain size and shape</subject><subject>Morphology</subject><subject>Natural energy</subject><subject>Photovoltaic conversion</subject><subject>Polycrystalline materials</subject><subject>Polycrystalline silicon thin films</subject><subject>Semiconducting films</subject><subject>Semiconducting glass</subject><subject>Semiconductor growth</subject><subject>Solar cells. Photoelectrochemical cells</subject><subject>Solar energy</subject><subject>Substrates</subject><subject>Thin films</subject><subject>Transmission electron microscopy</subject><issn>0927-0248</issn><issn>1879-3398</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNqNkctuFDEQRS0EEkPgE5C8QDwWTfxqP1YoigaINBKLhLVV7bHByN0eXD1E8_f0ZCLYQVa1ObduqQ4hLzl7zxnX59fMCdMxoexb594xxo3o-kdkxa1xnZTOPiarP8hT8gzxB2NMaKlWZFivN9d0zKFVmKAcMCOtie5qOYR2wBlKyVOkmEsOdaLz9zzRlMuINNVGsRZoNMRSkH5r9XaiMNNSb-kcx11sMO9bxOfkSYKC8cX9PCNfP65vLj93my-fri4vNl1Qks2dgV5x3Q8yADOD6blyygy9sFqAZNzqlJKLFoSLYnDJMTkMMNhotlYycFqekTenvbtWf-4jzn7MeLwNplj36I3SXGtp1UK-_icpTK-VMuJhoHT9AvYncPkjYovJ71oeoR08Z_4oyd9J8kcD3jl_J8kfc6_uCwADlNRgChn_hhVTztgF-3DC4vK_Xzk2jyHHKcRtbjHMflvzf4p-A2OhpmY</recordid><startdate>20000701</startdate><enddate>20000701</enddate><creator>Stöger, Michael</creator><creator>Nelhiebel, Michael</creator><creator>Schattschneider, Peter</creator><creator>Schlosser, Viktor</creator><creator>Breymesser, Alexander</creator><creator>Jouffrey, Bernard</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7SP</scope><scope>L7M</scope><scope>7TC</scope></search><sort><creationdate>20000701</creationdate><title>EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures</title><author>Stöger, Michael ; Nelhiebel, Michael ; Schattschneider, Peter ; Schlosser, Viktor ; Breymesser, Alexander ; Jouffrey, Bernard</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c430t-7a54165b3ca07b7514947b52862a30186fff9e8a29e2b9f903bbab8e7d830a963</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><topic>Applied sciences</topic><topic>Chemical vapour deposition</topic><topic>Electron energy loss spectroscopy</topic><topic>Electron energy-loss spectrometry</topic><topic>Energy</topic><topic>Exact sciences and technology</topic><topic>Grain size and shape</topic><topic>Morphology</topic><topic>Natural energy</topic><topic>Photovoltaic conversion</topic><topic>Polycrystalline materials</topic><topic>Polycrystalline silicon thin films</topic><topic>Semiconducting films</topic><topic>Semiconducting glass</topic><topic>Semiconductor growth</topic><topic>Solar cells. Photoelectrochemical cells</topic><topic>Solar energy</topic><topic>Substrates</topic><topic>Thin films</topic><topic>Transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Stöger, Michael</creatorcontrib><creatorcontrib>Nelhiebel, Michael</creatorcontrib><creatorcontrib>Schattschneider, Peter</creatorcontrib><creatorcontrib>Schlosser, Viktor</creatorcontrib><creatorcontrib>Breymesser, Alexander</creatorcontrib><creatorcontrib>Jouffrey, Bernard</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Electronics & Communications Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Mechanical Engineering Abstracts</collection><jtitle>Solar energy materials and solar cells</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Stöger, Michael</au><au>Nelhiebel, Michael</au><au>Schattschneider, Peter</au><au>Schlosser, Viktor</au><au>Breymesser, Alexander</au><au>Jouffrey, Bernard</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures</atitle><jtitle>Solar energy materials and solar cells</jtitle><date>2000-07-01</date><risdate>2000</risdate><volume>63</volume><issue>2</issue><spage>177</spage><epage>184</epage><pages>177-184</pages><issn>0927-0248</issn><eissn>1879-3398</eissn><abstract>The aim of this work is the quantitative chemical analysis of polycrystalline silicon thin films grown on glass substrates at temperatures <600°C by means of transmission electron microscopy (TEM) and electron energy-loss spectrometry (EELS). Specimens produced with two different methods were investigated. We found significant differences in grain size and morphology, as well as in the distribution of oxygen. A surprisingly high amount of Ba diffusion from the subtrate was detected.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/S0927-0248(99)00172-5</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0927-0248 |
| ispartof | Solar energy materials and solar cells, 2000-07, Vol.63 (2), p.177-184 |
| issn | 0927-0248 1879-3398 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_746166384 |
| source | ScienceDirect Journals |
| subjects | Applied sciences Chemical vapour deposition Electron energy loss spectroscopy Electron energy-loss spectrometry Energy Exact sciences and technology Grain size and shape Morphology Natural energy Photovoltaic conversion Polycrystalline materials Polycrystalline silicon thin films Semiconducting films Semiconducting glass Semiconductor growth Solar cells. Photoelectrochemical cells Solar energy Substrates Thin films Transmission electron microscopy |
| title | EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T13%3A35%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=EELS%20microanalysis%20of%20polycrystalline%20silicon%20thin%20films%20for%20solar%20cells%20grown%20at%20low%20temperatures&rft.jtitle=Solar%20energy%20materials%20and%20solar%20cells&rft.au=St%C3%B6ger,%20Michael&rft.date=2000-07-01&rft.volume=63&rft.issue=2&rft.spage=177&rft.epage=184&rft.pages=177-184&rft.issn=0927-0248&rft.eissn=1879-3398&rft_id=info:doi/10.1016/S0927-0248(99)00172-5&rft_dat=%3Cproquest_cross%3E27564472%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c430t-7a54165b3ca07b7514947b52862a30186fff9e8a29e2b9f903bbab8e7d830a963%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=27564395&rft_id=info:pmid/&rfr_iscdi=true |