Loading…

Simple method for cleaning gallium nitride (0001)

Achieving clean surfaces is a major and challenging requirement for the study of surfaces and surface reactions. We describe the use of synchrotron radiation (SR) to probe the electronic structure of the gallium nitride (GaN) (0001) surface that has undergone wet chemical cleaning sequences followed...

Full description

Saved in:
Bibliographic Details
Published in:Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2002-09, Vol.20 (5), p.1784-1786
Main Authors: Machuca, Francisco, Liu, Zhi, Sun, Yun, Pianetta, P., Spicer, W. E., Pease, R. F. W.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c421t-f53a6350d65f6eac3021edfc0e949bbf1ebb6fb44972fff0fac29d9ae328fb5e3
cites cdi_FETCH-LOGICAL-c421t-f53a6350d65f6eac3021edfc0e949bbf1ebb6fb44972fff0fac29d9ae328fb5e3
container_end_page 1786
container_issue 5
container_start_page 1784
container_title Journal of vacuum science & technology. A, Vacuum, surfaces, and films
container_volume 20
creator Machuca, Francisco
Liu, Zhi
Sun, Yun
Pianetta, P.
Spicer, W. E.
Pease, R. F. W.
description Achieving clean surfaces is a major and challenging requirement for the study of surfaces and surface reactions. We describe the use of synchrotron radiation (SR) to probe the electronic structure of the gallium nitride (GaN) (0001) surface that has undergone wet chemical cleaning sequences followed by heating. By using SR in the range of 200–1000 eV the core levels of Ga, N, O, and C are monitored. Immersion in a 4:1 solution of sulfuric acid (51%) to hydrogen peroxide (30%) followed by a 700 °C (200 °C below decomposition temperature) vacuum anneal (⩽10 −10   Torr ) results in a reduction of carbon and oxygen coverage to a few percent of a monolayer. This suggests a weakly bound oxide of carbon being chemisorbed to the GaN surface after the sulfuric acid/hydrogen peroxide treatment and it is removed by the heating.
doi_str_mv 10.1116/1.1503782
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_746241324</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>746241324</sourcerecordid><originalsourceid>FETCH-LOGICAL-c421t-f53a6350d65f6eac3021edfc0e949bbf1ebb6fb44972fff0fac29d9ae328fb5e3</originalsourceid><addsrcrecordid>eNp90EtLAzEUBeAgCtbqwn8wO60wNTev6Syl-IKCC3UdMpmbGslMxmQq-O-tVHQhuDqb75zFIeQU6BwA1CXMQVJeLdgemYBktFxIWe-TCa24KBlQOCRHOb9SShmjakLg0XdDwKLD8SW2hYupsAFN7_t1sTYh-E1X9H5MvsXifNuC2TE5cCZkPPnOKXm-uX5a3pWrh9v75dWqtILBWDrJjeKStko6hcZyygBbZynWom4aB9g0yjVC1BVzzlFnLKvb2iBnC9dI5FNyttsdUnzbYB5157PFEEyPcZN1JRQTwJnYytlO2hRzTuj0kHxn0ocGqr9e0aC_X9nai53N1o9m9LH_we8x_UI9tO4__Hf5E25IbyE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>746241324</pqid></control><display><type>article</type><title>Simple method for cleaning gallium nitride (0001)</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Machuca, Francisco ; Liu, Zhi ; Sun, Yun ; Pianetta, P. ; Spicer, W. E. ; Pease, R. F. W.</creator><creatorcontrib>Machuca, Francisco ; Liu, Zhi ; Sun, Yun ; Pianetta, P. ; Spicer, W. E. ; Pease, R. F. W.</creatorcontrib><description>Achieving clean surfaces is a major and challenging requirement for the study of surfaces and surface reactions. We describe the use of synchrotron radiation (SR) to probe the electronic structure of the gallium nitride (GaN) (0001) surface that has undergone wet chemical cleaning sequences followed by heating. By using SR in the range of 200–1000 eV the core levels of Ga, N, O, and C are monitored. Immersion in a 4:1 solution of sulfuric acid (51%) to hydrogen peroxide (30%) followed by a 700 °C (200 °C below decomposition temperature) vacuum anneal (⩽10 −10   Torr ) results in a reduction of carbon and oxygen coverage to a few percent of a monolayer. This suggests a weakly bound oxide of carbon being chemisorbed to the GaN surface after the sulfuric acid/hydrogen peroxide treatment and it is removed by the heating.</description><identifier>ISSN: 0734-2101</identifier><identifier>EISSN: 1520-8559</identifier><identifier>DOI: 10.1116/1.1503782</identifier><identifier>CODEN: JVTAD6</identifier><language>eng</language><subject>Annealing ; Chemical cleaning ; Chemisorption ; Electronic structure ; Hydrogen peroxide ; Monolayers ; Sulfuric acid ; Surface cleaning ; Surface reactions ; Synchrotron radiation</subject><ispartof>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films, 2002-09, Vol.20 (5), p.1784-1786</ispartof><rights>American Vacuum Society</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c421t-f53a6350d65f6eac3021edfc0e949bbf1ebb6fb44972fff0fac29d9ae328fb5e3</citedby><cites>FETCH-LOGICAL-c421t-f53a6350d65f6eac3021edfc0e949bbf1ebb6fb44972fff0fac29d9ae328fb5e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Machuca, Francisco</creatorcontrib><creatorcontrib>Liu, Zhi</creatorcontrib><creatorcontrib>Sun, Yun</creatorcontrib><creatorcontrib>Pianetta, P.</creatorcontrib><creatorcontrib>Spicer, W. E.</creatorcontrib><creatorcontrib>Pease, R. F. W.</creatorcontrib><title>Simple method for cleaning gallium nitride (0001)</title><title>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films</title><description>Achieving clean surfaces is a major and challenging requirement for the study of surfaces and surface reactions. We describe the use of synchrotron radiation (SR) to probe the electronic structure of the gallium nitride (GaN) (0001) surface that has undergone wet chemical cleaning sequences followed by heating. By using SR in the range of 200–1000 eV the core levels of Ga, N, O, and C are monitored. Immersion in a 4:1 solution of sulfuric acid (51%) to hydrogen peroxide (30%) followed by a 700 °C (200 °C below decomposition temperature) vacuum anneal (⩽10 −10   Torr ) results in a reduction of carbon and oxygen coverage to a few percent of a monolayer. This suggests a weakly bound oxide of carbon being chemisorbed to the GaN surface after the sulfuric acid/hydrogen peroxide treatment and it is removed by the heating.</description><subject>Annealing</subject><subject>Chemical cleaning</subject><subject>Chemisorption</subject><subject>Electronic structure</subject><subject>Hydrogen peroxide</subject><subject>Monolayers</subject><subject>Sulfuric acid</subject><subject>Surface cleaning</subject><subject>Surface reactions</subject><subject>Synchrotron radiation</subject><issn>0734-2101</issn><issn>1520-8559</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><recordid>eNp90EtLAzEUBeAgCtbqwn8wO60wNTev6Syl-IKCC3UdMpmbGslMxmQq-O-tVHQhuDqb75zFIeQU6BwA1CXMQVJeLdgemYBktFxIWe-TCa24KBlQOCRHOb9SShmjakLg0XdDwKLD8SW2hYupsAFN7_t1sTYh-E1X9H5MvsXifNuC2TE5cCZkPPnOKXm-uX5a3pWrh9v75dWqtILBWDrJjeKStko6hcZyygBbZynWom4aB9g0yjVC1BVzzlFnLKvb2iBnC9dI5FNyttsdUnzbYB5157PFEEyPcZN1JRQTwJnYytlO2hRzTuj0kHxn0ocGqr9e0aC_X9nai53N1o9m9LH_we8x_UI9tO4__Hf5E25IbyE</recordid><startdate>20020901</startdate><enddate>20020901</enddate><creator>Machuca, Francisco</creator><creator>Liu, Zhi</creator><creator>Sun, Yun</creator><creator>Pianetta, P.</creator><creator>Spicer, W. E.</creator><creator>Pease, R. F. W.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>7TC</scope></search><sort><creationdate>20020901</creationdate><title>Simple method for cleaning gallium nitride (0001)</title><author>Machuca, Francisco ; Liu, Zhi ; Sun, Yun ; Pianetta, P. ; Spicer, W. E. ; Pease, R. F. W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c421t-f53a6350d65f6eac3021edfc0e949bbf1ebb6fb44972fff0fac29d9ae328fb5e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Annealing</topic><topic>Chemical cleaning</topic><topic>Chemisorption</topic><topic>Electronic structure</topic><topic>Hydrogen peroxide</topic><topic>Monolayers</topic><topic>Sulfuric acid</topic><topic>Surface cleaning</topic><topic>Surface reactions</topic><topic>Synchrotron radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Machuca, Francisco</creatorcontrib><creatorcontrib>Liu, Zhi</creatorcontrib><creatorcontrib>Sun, Yun</creatorcontrib><creatorcontrib>Pianetta, P.</creatorcontrib><creatorcontrib>Spicer, W. E.</creatorcontrib><creatorcontrib>Pease, R. F. W.</creatorcontrib><collection>CrossRef</collection><collection>Mechanical Engineering Abstracts</collection><jtitle>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Machuca, Francisco</au><au>Liu, Zhi</au><au>Sun, Yun</au><au>Pianetta, P.</au><au>Spicer, W. E.</au><au>Pease, R. F. W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Simple method for cleaning gallium nitride (0001)</atitle><jtitle>Journal of vacuum science &amp; technology. A, Vacuum, surfaces, and films</jtitle><date>2002-09-01</date><risdate>2002</risdate><volume>20</volume><issue>5</issue><spage>1784</spage><epage>1786</epage><pages>1784-1786</pages><issn>0734-2101</issn><eissn>1520-8559</eissn><coden>JVTAD6</coden><abstract>Achieving clean surfaces is a major and challenging requirement for the study of surfaces and surface reactions. We describe the use of synchrotron radiation (SR) to probe the electronic structure of the gallium nitride (GaN) (0001) surface that has undergone wet chemical cleaning sequences followed by heating. By using SR in the range of 200–1000 eV the core levels of Ga, N, O, and C are monitored. Immersion in a 4:1 solution of sulfuric acid (51%) to hydrogen peroxide (30%) followed by a 700 °C (200 °C below decomposition temperature) vacuum anneal (⩽10 −10   Torr ) results in a reduction of carbon and oxygen coverage to a few percent of a monolayer. This suggests a weakly bound oxide of carbon being chemisorbed to the GaN surface after the sulfuric acid/hydrogen peroxide treatment and it is removed by the heating.</abstract><doi>10.1116/1.1503782</doi><tpages>3</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0734-2101
ispartof Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2002-09, Vol.20 (5), p.1784-1786
issn 0734-2101
1520-8559
language eng
recordid cdi_proquest_miscellaneous_746241324
source American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)
subjects Annealing
Chemical cleaning
Chemisorption
Electronic structure
Hydrogen peroxide
Monolayers
Sulfuric acid
Surface cleaning
Surface reactions
Synchrotron radiation
title Simple method for cleaning gallium nitride (0001)
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T20%3A06%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Simple%20method%20for%20cleaning%20gallium%20nitride%20(0001)&rft.jtitle=Journal%20of%20vacuum%20science%20&%20technology.%20A,%20Vacuum,%20surfaces,%20and%20films&rft.au=Machuca,%20Francisco&rft.date=2002-09-01&rft.volume=20&rft.issue=5&rft.spage=1784&rft.epage=1786&rft.pages=1784-1786&rft.issn=0734-2101&rft.eissn=1520-8559&rft.coden=JVTAD6&rft_id=info:doi/10.1116/1.1503782&rft_dat=%3Cproquest_cross%3E746241324%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c421t-f53a6350d65f6eac3021edfc0e949bbf1ebb6fb44972fff0fac29d9ae328fb5e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=746241324&rft_id=info:pmid/&rfr_iscdi=true