Method for analyzing series resistance and diode quality factors from field data of photovoltaic modules

A procedure is detailed in which the effects of series resistance and diode quality factors are separately analyzed and quantified using current–voltage ( IV) data gathered in situ from three photovoltaic (PV) modules. Series resistance losses are implicated to be largely responsible for reduction i...

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Bibliographic Details
Published in:Solar energy materials and solar cells 1998-10, Vol.55 (3), p.291-297
Main Author: del Cueto, J.A.
Format: Article
Language:English
Subjects:
Amorphous silicon
Applied sciences
Current voltage characteristics
Diode quality factor
Electric losses
Electric resistance
Energy
Equipments, installations and applications
Exact sciences and technology
Natural energy
Photovoltaic conversion
Photovoltaic module
Semiconducting cadmium telluride
Semiconductor diodes
Series resistance
Solar energy
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Summary:A procedure is detailed in which the effects of series resistance and diode quality factors are separately analyzed and quantified using current–voltage ( IV) data gathered in situ from three photovoltaic (PV) modules. Series resistance losses are implicated to be largely responsible for reduction in the fill factor values for intensities of 60% of one sun or greater. The data presented are from one cadmium telluride (CdTe) and two amorphous silicon (a-Si) modules and were taken in field deployment with a data acquisition system.
ISSN:0927-0248
1879-3398
DOI:10.1016/S0927-0248(98)00123-8