Structural, optical and microscopic studies of tungsten substituted molybdenum diselenide thin films

A modified chemical bath deposition method has been developed to prepare Mo 1− x W x Se 2 layer type semiconductor thin films. Various preparative conditions of the thin films are outlined. The films were characterized by X-ray diffraction, optical absorption, electrical measurements and thermoelect...

Full description

Saved in:
Bibliographic Details
Published in:Journal of alloys and compounds 2010-06, Vol.499 (2), p.187-193
Main Authors: Sathe, D.J., Hankare, P.P., Manikshete, A.H., Chate, P.A., Patil, A.A.
Format: Article
Language:English
Subjects:
Chemical synthesis
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Diffraction
Electrical properties of specific thin films
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Exact sciences and technology
Liquid phase epitaxy
deposition from liquid phases (melts, solutions, and surface layers on liquids)
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Molybdenum
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Other inorganic semiconductors
Other semiconductors
Physics
Resistivity
Semiconductors
Thermoelectricity
Thin films
Tungsten
X-ray diffraction
X-rays
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A modified chemical bath deposition method has been developed to prepare Mo 1− x W x Se 2 layer type semiconductor thin films. Various preparative conditions of the thin films are outlined. The films were characterized by X-ray diffraction, optical absorption, electrical measurements and thermoelectric techniques. The grown films were found to be uniform, well adherent to substrate and brown in color. The X-ray diffraction (XRD) study indicates the polycrystalline nature in single hexagonal phase over whole range of composition. Analysis of absorption spectra gave direct type of band gap, the magnitude of which increases slightly as tungsten content in the film is increased and electrical conductivity at room temperature was found to be 10 −5 to 10 −2 (Ω cm) −1. All the films show n-type conductivity.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2010.03.146