Liquid Crystal Alignment Capabilities on SiNx Thin Films Via Ion-Beam Irradiation

The aligned liquid crystals (LCs) display on SiNx thin films using ion-beam (IB) irradiation was studied with controllability of pretilt angle depending on incident energies of the IB. The LCs alignment property for the SiNx thin films were observed to verify the practical application potential. A g...

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Bibliographic Details
Published in:Ferroelectrics 2010-01, Vol.394 (1), p.1-7
Main Authors: Kim, Byoung-Yong, Kim, Young-Hwan, Park, Hong-Gyu, Oh, Byeong-Yun, Hwang, Jeong-Yeon, Na, Hyun-Jae, Lee, Won-Kyu, Lim, Ji-Hun, Seo, Dae-Shik, Han, Jeong-Min
Format: Article
Language:English
Subjects:
Alignment
Atomic force microscopy
Condensed matter: structure, mechanical and thermal properties
Energy use
Exact sciences and technology
Ferroelectrics
Ion beam irradiation
Ion beams
Ion radiation effects
Irradiation
LCDs
Liquid crystal alignment
Liquid crystal displays
Liquid crystals
Microscopy
Orientational order of liquid crystals
electric and magnetic field effects on order
PECVD
Physical radiation effects, radiation damage
Physics
Pretilt angle
Radiation
SiNx
Structure of solids and liquids
crystallography
Thin films
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Summary:The aligned liquid crystals (LCs) display on SiNx thin films using ion-beam (IB) irradiation was studied with controllability of pretilt angle depending on incident energies of the IB. The LCs alignment property for the SiNx thin films were observed to verify the practical application potential. A good LCs alignment of vertical alignment LCs cells on SiNx thin film surfaces irradiated with incident IB energy of 1800eV was achieved. The atomic force microscopy (AFM) images of LCs on SiNx thin film surfaces irradiated with IB energy was used for the surface analysis.
ISSN:0015-0193
1563-5112
DOI:10.1080/00150191003677296