Angle-resolved photoemission spectroscopy and imaging with a submicrometre probe at the SPECTROMICROSCOPY-3.2L beamline of Elettra

The extensive upgrade of the experimental end‐station of the SPECTROMICROSCOPY‐3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle‐resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal insi...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2010-07, Vol.17 (4), p.445-450
Main Authors: Dudin, Pavel, Lacovig, Paolo, Fava, Claudio, Nicolini, Eugenio, Bianco, Anna, Cautero, Giuseppe, Barinov, Alexei
Format: Article
Language:English
Subjects:
angle-resolved photoemission
band structure
beamlines and optics
Dispersions
Flakes
Graphite
Imaging
Monitoring
Photoelectron spectroscopy
scanning microscopy
Synchrotrons
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Summary:The extensive upgrade of the experimental end‐station of the SPECTROMICROSCOPY‐3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle‐resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal inside selected acquisition angle and energy windows can be performed. As a test case, angle‐resolved photoemission spectroscopy from single flakes of highly oriented pyrolitic graphite and imaging of the flakes with image contrast owing to rotation of the band dispersion of different flakes are presented.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S0909049510013993