High-frequency dielectric measurements

The demands on dielectric material measurements have increased over the years as electrical components have been miniaturized and device frequency bands have increased. Well-characterized dielectric measurements on thin materials are needed for circuit design, minimization of crosstalk, and characte...

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Bibliographic Details
Published in:IEEE instrumentation & measurement magazine 2010-04, Vol.13 (2), p.24-31
Main Authors: Baker-Jarvis, James, Janezic, Michael D., Degroot, Donald C.
Format: Magazinearticle
Language:English
Subjects:
Antennas
Circuit synthesis
Crosstalk
Dielectric materials
Dielectric measurements
Electric variables measurement
Electromagnetic waves
Electronics
Exploration
Fixtures
Frequency measurement
Frequency ranges
Geometry
Instrumentation
Minimization
Product development
Radio frequencies
Transmission lines
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Summary:The demands on dielectric material measurements have increased over the years as electrical components have been miniaturized and device frequency bands have increased. Well-characterized dielectric measurements on thin materials are needed for circuit design, minimization of crosstalk, and characterization of signal-propagation speed. Bulk material applications have also increased. For accurate dielectric measurements, each measurement band and material geometry requires specific fixtures. Engineers and researchers must carefully match their material system and uncertainty requirements to the best available measurement system. Broadband measurements require transmission-line methods, and accurate measurements on low-loss materials are performed in resonators. The development of the most accurate methods for each application requires accurate fixture selection in terms of field geometry, accurate field models, and precise measurement apparatus.
ISSN:1094-6969
1941-0123
DOI:10.1109/MIM.2010.5438334