Reducing Measurement Uncertainties Using Bias Cycled Measurement in MOS Dosimetry at Different Temperatures

Temperature dependence of MOS dosimeters response used under the Bias Controlled Cycled Measurement technique is investigated. The use of the biasing technique allows the compensation of temperature-induced changes in the response of the sensors, and reduces at least ten times the dose measurement e...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2010-04, Vol.57 (2), p.848-853
Main Authors: Lipovetzky, Jose, Redin, Eduardo Gabriel, Inza, Mariano Andres Garcia, Carbonetto, Sebastian, Faigon, Adrian
Format: Article
Language:English
Subjects:
Bias
Dosimeters
Dosimetry
Electron traps
Error analysis
Error detection
Laboratories
Measurement uncertainty
Metal oxide semiconductors
MOS devices
MOSFETs
Permissible error
Physics
Radiation effects
temperature
Temperature dependence
Temperature sensors
Threshold voltage
Voltage control
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Summary:Temperature dependence of MOS dosimeters response used under the Bias Controlled Cycled Measurement technique is investigated. The use of the biasing technique allows the compensation of temperature-induced changes in the response of the sensors, and reduces at least ten times the dose measurement error caused by undesired threshold voltage shifts.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2010.2042178