Focused Ion Beam (FIB) tomography of nanoindentation damage in nanoscale metal/ceramic multilayers

A 3D FIB tomography approach to characterise and visualise the deformation and damage due to nanoindentation of Al/SiC multilayered composites is presented. This tomography provides a clear and important understanding of deformation processes under indentation loading not possible by conventional 2D...

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Bibliographic Details
Published in:Materials characterization 2010-04, Vol.61 (4), p.481-488
Main Authors: Singh, D.R.P., Chawla, N., Shen, Y.-L.
Format: Article
Language:English
Subjects:
3D Materials Science
Cross-disciplinary physics: materials science
rheology
Damage
Deformation
Exact sciences and technology
Focused Ion Beam (FIB)
Materials science
Multilayers
Nanocomposites
Nanoindentation
Nanostructure
Phase diagrams and microstructures developed by solidification and solid-solid phase transformations
Physics
Serial sectioning
Silicon carbide
Solidification
Tomography
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Summary:A 3D FIB tomography approach to characterise and visualise the deformation and damage due to nanoindentation of Al/SiC multilayered composites is presented. This tomography provides a clear and important understanding of deformation processes under indentation loading not possible by conventional 2D approaches.
ISSN:1044-5803
1873-4189
DOI:10.1016/j.matchar.2010.01.005