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Risk factors for complications during intracranial electrode recording in presurgical evaluation of drug resistant partial epilepsy

Background Intracranial electrode monitoring is still required in epilepsy surgery; however, it is associated with significant morbidity. Objective To identify risk factors associated with complications during invasive intracranial EEG monitoring. Materials and methods Retrospective study of all pat...

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Bibliographic Details
Published in:Acta neurochirurgica 2009, Vol.151 (1), p.37-50
Main Authors: Wong, Chong H., Birkett, Julie, Byth, Karen, Dexter, Mark, Somerville, Ernest, Gill, Deepak, Chaseling, Ray, Fearnside, Michael, Bleasel, Andrew
Format: Article
Language:English
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Summary:Background Intracranial electrode monitoring is still required in epilepsy surgery; however, it is associated with significant morbidity. Objective To identify risk factors associated with complications during invasive intracranial EEG monitoring. Materials and methods Retrospective study of all patients undergoing invasive monitoring at Westmead between 1988–2004. From detailed chart reviews, the following variables were recorded: duration of intracranial monitoring, the site of grid implantation, number of grids and electrodes, seizure frequency, postoperative complications and seizure outcome. Results Seventy-one patients (median age: 24 years) underwent subdural electrode implantation; 62% had extratemporal lobe epilepsy and 46% were non-lesional. Of the 58 monitored patients who had cortical resections, 45 had good seizure outcomes. Complications related to subdural electrode implantation included transient complications requiring no treatment (12.7%), transient complications requiring treatment (9.9%) and two deaths (2.8%). Specific complications included subdural haemorrhage, transient neurological deficit, infarction and osteomyelitis. The two deaths occurred within 48 h of implantation were related to raised intracranial pressure (one venous infarction, one unexplained). Complications were associated with maximal size of grid ( p  
ISSN:0001-6268
0942-0940
DOI:10.1007/s00701-008-0171-7