Core level photoionization on free sub-10-nm nanoparticles using synchrotron radiation

A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-...

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Bibliographic Details
Published in:Review of scientific instruments 2010-08, Vol.81 (8), p.085107-085107-5
Main Authors: Meinen, Jan, Khasminskaya, Svetlana, Eritt, Markus, Leisner, Thomas, Antonsson, Egill, Langer, Burkhard, Rühl, Eckart
Format: Article
Language:English
Subjects:
ATMOSPHERIC CHEMISTRY
CHARGED PARTICLES
CHEMICAL REACTIONS
EFFICIENCY
ELECTRONS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
MATERIALS SCIENCE
NANOSCIENCE AND NANOTECHNOLOGY
NANOSTRUCTURES
PARTICLE BEAMS
PARTICLES
PHOTOIONIZATION
PRESSURE RANGE MEGA PA 10-100
SILICON OXIDES
SOFT X RADIATION
SURFACES
SYNCHROTRON RADIATION
TIME-OF-FLIGHT SPECTROMETERS
X-RAY PHOTOELECTRON SPECTROSCOPY
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Summary:A novel instrument is presented, which permits studies on singly charged free nanoparticles in the diameter range from 1 to 30 nm using synchrotron radiation in the soft x-ray regime. It consists of a high pressure nanoparticle source, a high efficiency nanoparticle beam inlet, and an electron time-of-flight spectrometer suitable for probing surface and bulk properties of free, levitated nanoparticles. We show results from x-ray photoelectron spectroscopy study near the Si   L 3 , 2 -edge on 8.2 nm SiO 2 particles prepared in a nanoparticle beam. The possible use of this apparatus regarding chemical reactions on the surface of nanometer-sized particles is highlighted. This approach has the potential to be exploited for process studies on heterogeneous atmospheric chemistry.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.3475154