Standardless Atom Counting in Scanning Transmission Electron Microscopy

We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the meth...

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Bibliographic Details
Published in:Nano letters 2010-11, Vol.10 (11), p.4405-4408
Main Authors: LeBeau, James M, Findlay, Scott D, Allen, Leslie J, Stemmer, Susanne
Format: Article
Language:English
Subjects:
Algorithms
Condensed matter: structure, mechanical and thermal properties
Electron, ion, and scanning probe microscopy
Exact sciences and technology
Image Interpretation, Computer-Assisted - methods
Microscopy, Electron, Scanning Transmission - methods
Physics
Structure of solids and liquids
crystallography
Transmission, reflection and scanning electron microscopy(including ebic)
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Summary:We demonstrate that high-angle annular dark-field imaging in scanning transmission electron microscopy allows for quantification of the number and location of all atoms in a three-dimensional, crystalline, arbitrarily shaped specimen without the need for a calibration standard. We show that the method also provides for an approach to directly measure the finite effective source size of a scanning transmission electron microscope.
ISSN:1530-6984
1530-6992
DOI:10.1021/nl102025s