Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an importan...

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Bibliographic Details
Published in:Ultramicroscopy 2010-03, Vol.110 (4), p.325-329
Main Authors: Kewish, Cameron M., Thibault, Pierre, Dierolf, Martin, Bunk, Oliver, Menzel, Andreas, Vila-Comamala, Joan, Jefimovs, Konstantins, Pfeiffer, Franz
Format: Article
Language:English
Subjects:
Beams (radiation)
Coherence
Diffraction
Diffractive imaging
Nanocomposites
Nanomaterials
Nanostructure
Phase retrieval
Ptychography
Wavefront characterization
X-ray mirrors
X-ray optics
X-rays
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Summary:A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2010.01.004