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Structural and morphological study of ZnO thin films electrodeposited on n-type silicon
In this work, we report on the electrodeposition of ZnO thin films on n-Si (1 0 0) and glass substrates. The influence of the deposition time on the morphology of ZnO thin films was investigated. The ZnO thin films were characterized by X-ray diffraction (XRD), energy dispersive X-ray (EDS) and scan...
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Published in: | Applied surface science 2010-10, Vol.256 (24), p.7442-7445 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | In this work, we report on the electrodeposition of ZnO thin films on n-Si (1
0
0) and glass substrates. The influence of the deposition time on the morphology of ZnO thin films was investigated. The ZnO thin films were characterized by X-ray diffraction (XRD), energy dispersive X-ray (EDS) and scanning electron microscopy (SEM). The results show a variation of ZnO texture from main (0
0
2) at 10
min to totally (1
0
1) at 15
min deposition time. The photoluminescence (PL) studies show that both UV (∼382
nm) and blue (∼432
nm) luminescences are the main emissions for the electrodeposited ZnO films. In addition, the film grown at 15
min indicates an evident decrease of the yellow-green (∼520
nm) emission band comparing with that of 10
min. Finally, transmittance spectra show a high transmission value up to 85% in the visible wavelength range. Such results would be very interesting for solar cells applications. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/j.apsusc.2010.05.087 |