In situ and postradiation analysis of mechanical stress in Al2O3:Cr induced by swift heavy-ion irradiation

Optical spectroscopy and TEM techniques have been applied to study the radiation damage and correlated mechanical stresses in Al2O3 and Al2O3:Cr single crystals induced by (1-3) MeV/amu Kr, Xe and Bi ion irradiation. Mechanical stresses were evaluated in situ using a piezospectroscopic effect throug...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2010-10, Vol.268 (19), p.3023-3026
Main Authors: Skuratov, V.A., Bujnarowski, G., Kovalev, Yu.S., O’Connell, J., Havanscak, K.
Format: Article
Language:English
Subjects:
Accumulation
Beam interactions
Compressive properties
Confocal
Electronics
Ionization
Irradiation
Stresses
Transmission electron microscopy
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Summary:Optical spectroscopy and TEM techniques have been applied to study the radiation damage and correlated mechanical stresses in Al2O3 and Al2O3:Cr single crystals induced by (1-3) MeV/amu Kr, Xe and Bi ion irradiation. Mechanical stresses were evaluated in situ using a piezospectroscopic effect through the shift of the respective lines in ionoluminescence spectra. It was found that dose dependence of the stress level for Xe and Bi ions, when ionization energy loss exceeds the threshold of damage formation via electronic excitations, exhibits several alternate stages showing the build-up and relaxation of stresses. The beginning of relaxation stages is observed at fluences associated with beginning of individual ion track regions overlapping. The residual stress profiles through the ion irradiated layers were deduced from depth-resolved photostimulated spectra using laser confocal scanning microscopy set-up. It was determined that stresses are compressive in basal plane and tensile in perpendicular direction in all samples irradiated with high energy ions.
ISSN:0168-583X
DOI:10.1016/j.nimb.2010.05.032